Mahr Metrology - MarForm MFU 110 Reference Formtester
Mahr Metrology - MarForm MFU 110 Reference Formtester Formtester Dimensional Metrology System Malaysia, Selangor, Kuala Lumpur (KL) Supplier, Suppliers, Supply, Supplies | Obsnap Instruments Sdn Bhd
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Reference form measuring machine for the precision measuring room and production with tactile and optical probe.
  • Use of the benefits of the most modern, optical metrology
  • Non-tacticle optical form measurement of sensitive parts
  • Particularly high measuring accuracy
  • Lowers your production costs
  • For use directly in production
  • Highest degree of automation
The high-precision MarForm MFU 110 measuring machine is based on the tried and tested MFU 100 with the addition of a high-speed C-axis. The highly flexible MarVision IPS 15 optical measuring system is optionally available. It is a tactile and optical probe for high-precision measuring tasks in measuring rooms or in production.


Technical Data

Roundness deviation (µm+µm/mm measuring height)
0,01 + 0,0002
Roundness deviation (µm+µm/mm measuring height)
0,02 + 0,0004
Axial runout deviation (µm+µm/mm measuring radius)
0,02 + 0,0002
Axial runout deviation (µm+µm/mm measuring radius)
0,04 + 0,0004
Centering and tilting table
automatic
Table diameter (mm)
180
Table load capacity, centered (N)
200
Speed (rpm) 50 Hz / 60 Hz
0.1 to 200
Straightness deviation / 100 mm measuring path (µm), Z axis
0.1
Straightness deviation / total measuring path (µm), Z axis
0.3
Parallelism deviation Z-/C axis in tracing direction, measuring path (µm)
0.6
Measuring speed (mm/s), Z axis
0.1 to 50
Positioning speed (mm/s), Z axis
0.1 to 50
Straightness deviation / total measuring path (µm), X axis
0.3
Perpendicularity X/C axis, measuring path (µm)
0.3
Positioning speed (mm/s), X axis
0.1 to 50
Measuring speed (mm/s), X axis
0.01 to 50



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