Mahr Metrology - XC 2 MarWin MIT CD 120
Quantity
Your entry into precision contour measurement
- The quick, simple and inexpensive 2D contour measuring system satisfies all demands in terms of accuracy and range of evaluation criteria
- Consistently delivers safe and reliable results
- Parameters that are dependent on datum elements are recalculated as soon as a datum element is changed
- Password protected user access prevents improper use
- Outstanding calibration processes including geometry calibration, measuring force calibration, bend compensation, etc.
- Sturdy, rigid probes
- Smooth running, sturdy and accurate drive unit
- Automatic lowering and raising of the probe arm at individually adjustable speeds
- Patented probe arm attachement for collision protection
Technical Data
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Resolution
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In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm |
|---|---|
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Sampling angle
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On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
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Start of traversing length (in X)
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0.2 mm
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Tip radius
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25 µm
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Contacting speed (in Z)
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0.1 to 1 mm/s
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Probe arm length
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175 mm, 350 mm
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End of traversing length (in X)
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120 mm
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Positioning speed
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In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s |
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Guide deviation
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< 1 µm (over 120 mm)
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Measuring speed
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0.2 mm/s to 4 mm/s
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Measuring range mm
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(in Z) 50 mm
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Traversing lengths
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0.2 mm to 120 mm
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Measuring force (N)
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1 mN to 120 mN
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