Mahr Metrology - MarSurf M 400
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MarSurf--M_400--3760426--FL--EN--2015-11-19.pdf (3.5 MB)
MarSurf--M_400_C--3760570--FL--EN--2015-11-19.pdf (1.48 MB)
MarSurf--M_400--3760426--FL--EN--2015-11-19.pdf (3.5 MB) MarSurf--M_400_C--3760570--FL--EN--2015-11-19.pdf (1.48 MB)| Features | ||
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MarSurf M 400. The best of the 'mobiles'
Surface evaluation using skidless tracing is not only needed in the measuring room but is required more and more in production as well. This usually means higher demands on operator qualities, more time, more adjustment work. In the line of 'mobile surface metrology', MarSurf M 400 offers this required scope of performance and at the same time simple and fast operability.
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Measuring principle
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Stylus method
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Probe
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BFW skidless system
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Measuring range mm
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+/- 250 µm (up to +/- 750 µm with 3x probe arm length)
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Profile resolution
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Measuring range +/- 250 µm: 8 nm
Measuring range +/- 25 µm: 0.8 nm |
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Filter according to ISO/JIS
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Gaussian filter as per ISO 11562
Filter as per ISO 13565 |
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Number n of sampling length according to ISO/JIS
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1-5
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Contacting speeds
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0,2 mm/s; 1,0 mm/s
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Measuring force (N)
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0.75 mN
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Weight drive unit
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approx. 0.9 kg
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Weight measuring instrument
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approx. 1.0 kg
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Surface parameters
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Over 50 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
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